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  • Park NX-Hivac
    High vacuum AFM for failure analysis
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  • NX10-AFM-main
    Park NX10 The quickest path to innovative research
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  • NX20-AFM-main
    Park NX20 The premiere choice for failure analysis
    and large sample research
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    Park NX-Wafer Automated Industrial AFM
    for In-line Wafer Inspection and Metrology
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  • nx-hdm AFM
    Park NX-HDM Simply the best AFM for Media & Substrate Manufacturing
    • Higher Throughput, Automatic Defect Review
    • Accurate Sub-Angstrom Surface Roughness
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Atomic Force Microscopy