Data accuracy is of paramount importance to nanotechnology researchers as the credibility of their research depends upon accurate results. Park NX10, the world’s most accurate AFM, is the flagship AFM of Park's new product line. Park NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. Park NX10 is the world’s premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. As Park’s most user-friendly AFM, Park NX10 makes AFM convenient and intuitive for new and experienced users alike.

Accurate AFM Imaging by Crosstalk Elimination
  • Industry leading XYZ scan linearity with two independent flexure scanners for sample and tip
  • Best out-of-plane motion of less than 1 nm over entire XY scan range
  • Z scanner linearity of less than 0.015%
  • Reduced XY scanner ringing by forward sine-scan algorithm

Accurate AFM Scan by True Non-Contact Mode^TM
  • Industry leading Z-scanner bandwidth of more than 9 kHz, or Z-servo speed of more than 62 mm/sec tip velocity
  • Fastest scan speed in non-contact mode imaging
  • Less tip wear for prolonged high-quality scans
  • Minimized sample damage or modification

Accurate AFM Measurement by True Sample Topography^TM
  • Sample topography measured by industry leading low noise Z detector
  • Industry leading, small forward and backward scan gap of less than 0.15%
  • Minimized system drift and hysteresis by thermally matched components
  • Active temperature control of acoustic enclosure

NX User Productivity
  • Easy tip exchange with wide open side access to the tip and sample
  • Easy, intuitive laser alignment with pre-aligned tip mount and patented on-axis, top down view
  • Fast automatic tip approach to sample surface within 10 seconds
  • 24 bit digital electronics with three internal lock-ins, Q-control, and spring constant calibration