Fully Automated Industrial In-line AFM for Slider Metrology
  • Automatic data acquisition and slider metrology analysis 
  • Allowable sample type: rowbars and sliders
  • Automatic tip exchange (optional)
  • Automatic tilting stage (optional)

Artifact-Free Metrology by Crosstalk Elimination
  • Unique decoupled XY scanning system provides a flat scanning stage
  • Flat and linear XY scan removes artifacts from background curvature
  • Accurate height and angle measurements with PTR Gauge Repeatability of less than 0.1 nm (1 sigma)
  • Superior tool to tool matching.

True Non-Contact Mode^TM Maintains a Sharp Tip for High-resolution Imaging
  • Less tip wear for prolonged high-quality and high-resolution imaging
  • Minimized sample damage or modification
  • Immunity from parameter-dependent results observed in tapping imaging

High Throughput Feature Measurement by Programmable Data Density (PDD)
  • Faster imaging of the region of interest by variable pixel density
  • Automatically detects and acquires high resolution image of small region of interest
  • Obtains PTR, writer pole, and other features, All In One image scan

Nanotechnology Solutions Partner
  • Trusted partnership with customers to meet the fast changing requirements
  • Application specific solutions that maximize throughput
  • Modular software and hardware platform enable rapid response