| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
NSC14/Cr-Au |
5 |
160 |
Mikromasch |
▪ Cantilever with lower force constant for EFM
▪ Conductive tip for electrical application, Coated with Cr-Au |
|
|
|
PPP-NCSTAu |
7.4 |
160 |
Nanosensors |
▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Au |
|
|
|
PPP-EFM |
2.8 |
75 |
Nanosensors |
▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Pt-Ir |
|
|
|
CDT-CONTR |
0.2 |
13 |
Nanosensors |
▪ Contact cantilever for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip |
|
|
|
CDT-NCHR |
42 |
330 |
Nanosensors |
▪ Cantilever with high resonant frequency for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip |
|
|
|
NSC36/Cr-Au |
0.95
1.75
0.6 |
105
155
75 |
Mikromasch |
▪ Contact cantilever for EFM, 3 cantilevers on a chip
▪ Conductive tip for electrical application, Coated with Cr-Au |
|
|
|
Multi75E |
3 |
75 |
Budget Sensors |
▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Cr-Pt |
|
|
|
Platinum |
18 |
14 |
- |
▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA |
|
|
Research
AFM
Probes
-
EFM/DC-EFM/SKPM 