Probes - Conductive AFM / VECA / ULCA

Conductive AFM / VECA / ULCA
Probe Force Constant
(N/m)
Frequency
(kHz )
Manufacture Short Description
(Click Probe for detailed specification)
Quote
CDT-CONTR 0.2 13 Nanosensors ▪ Contact cantilever for Conductive AFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip
PPP-CONTSCPt 0.2 13 Nanosensors ▪ Contact cantilever with higher Q factor for Conductive AFM
▪ Electrically conductive tip, Coated with Pt-Ir
Platinum 0.2 13 - ▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA
NSC18/Cr-Au 3.5 75 Mikromasch ▪ Contact cantilever for Conductive AFM, Backside reflex coating
▪ Electrically conductive tip, Coated with Cr-Au


Atomic Force Microscope
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