|
|
 Probes |
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
PPP-NCHR |
42 |
330 |
Nanosensors |
▪ Non-contact cantilever with high resonant frequency
▪ Backside reflex coating |
|
|
|
SSS-NCHR |
42 |
330 |
Nanosensors |
▪ Non-contact cantilever with high resonant frequency, backside reflex coating
▪ Tip visibility from top |
|
|
|
PPP-NCH |
42 |
330 |
Nanosensors |
▪ Non-contact cantilever with high resonant frequency |
|
|
|
SSS-NCH |
42 |
330 |
Nanosensors |
▪ Non-contact cantilever with super sharp tip
▪ Tip radius: 2 nm typical, < 5 nm max. |
|
|
|
PPP-NCLR |
48 |
190 |
Nanosensors |
▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz
▪ Backside reflex coating |
|
|
|
SSS-NCLR |
48 |
190 |
Nanosensors |
▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz, backside reflex
▪ Tip radius: 2 nm typical, < 5 nm max. |
|
|
|
PPP-NCL |
48 |
190 |
Nanosensors |
▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz |
|
|
|
SSS-NCL |
48 |
190 |
Nanosensors |
▪ Non-contact cantilever with low resonant frequency of ~ 200 kHz
▪ Tip radius: 2 nm typical, < 5 nm max. |
|
|
|
NSC15 |
40 |
325 |
Mikromasch |
▪ Non-contact cantilever
▪ Backside reflex coating |
|
|
|
AR5-NCH |
42 |
330 |
Nanosensors |
▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 7:1 |
|
|
|
AR5-NCHR |
42 |
330 |
Nanosensors |
▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 7:1 |
|
|
|
AR5T-NCHR |
42 |
330 |
Nanosensors |
▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 7:1, and the tip is tilted 13°. |
|
|
|
AR10-NCH |
42 |
330 |
Nanosensors |
▪ Noncontact cantilever with High aspect ratio tip
▪ Typical aspect ratio of the tip is 12:1 |
|
|
|
AR10-NCHR |
42 |
330 |
Nanosensors |
▪ Noncontact cantilever with High aspect ratio tip
▪ Typical aspect ratio of the tip is 12:1 |
|
|
|
AR10T-NCHR |
42 |
330 |
Nanosensors |
▪ Noncontact cantilever with High aspect ratio tip, Backside reflex coating
▪ Typical aspect ratio of the tip is 12:1, and the tip is tilted 13°. |
|
|
|
CNT-NCH |
42 |
330 |
Nanosensors |
▪ Noncontact cantilever with Carbon nanotube tip
▪ Length of the CNT tip: < 750 nm. |
|
|
|
OMCL-AC160TS |
26 |
300 |
Olympus |
▪ Non-contact cantilever with high resonant frequency, backside reflex coating
▪ Tip visibility from top |
|
|
|
ATEC-NC |
45 |
335 |
Nanosensors |
▪ Non-contact cantilever
▪ Tip visibility from top |
|
|
|
ACTA |
40 |
300 |
AppNano |
▪ Non-contact cantilever
▪ Backside reflex coating |
|
|
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
NSC36 |
0.95
1.75
0.6 |
105
155
75 |
Mikromasch |
▪ Contact cantilever, Backside reflex coating
▪ 3 cantilevers on a chip |
|
|
|
PPP-CONTSCR |
0.2 |
23 |
Nanosensors |
▪ Contact cantilever with higher Q factor
▪ Backside reflex coating |
|
|
|
NSC36/Si3N4 |
0.95
1.75
0.6 |
105
155
75 |
Mikromasch |
▪ Contact cantilever, 3 cantilevers on a chip
▪ Si3N4 layer on cantilevers (chemically inert and more hydrophobic than silicon |
|
|
|
PNP-DB |
0.48
0.06 |
67
17 |
Nanoworld |
▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 cantilevers on a chip |
|
|
|
PNP-TR |
0.32
0.08 |
67
17 |
Nanoworld |
▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 triangular cantilevers on a chip |
|
|
| LFM (Lateral Force Microscopy) |
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
PPP-LFMR |
0.2 |
23 |
Nanosensors |
▪ Contact cantilever with higher sensitivity to lateral/frictional force
▪ Backside reflex coating |
|
|
|
OMCL-TR800PSA |
0.38
0.73
0.05
0.10 |
68
71
18
19 |
Olympus |
▪ Contact cantilever for imaging soft biological samples
▪ Backside reflex coating |
|
|
| FMM
(Force Modulation Microscopy |
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
PPP-FMR |
2.8 |
75 |
Nanosensors |
▪ Cantilever of optimized force constant for FMM
▪ Backside reflex coating |
|
|
|
DT-FMR |
2.8 |
75 |
Nanosensors |
▪ Cantilever of optimized force constant for FMM
▪ Diamond-coated tip, Backside reflex coating |
|
|
|
NSC14/Si3N4 |
5 |
160 |
Mikromasch |
▪ Cantilever with lower force constant for FMM and Noncontact mode
▪ Si3N4 layer on cantilevers (chemically inert and more hydrophobic than silicon |
|
|
| Conductive AFM / VECA / ULCA |
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
CDT-CONTR |
0.2 |
13 |
Nanosensors |
▪ Contact cantilever for Conductive AFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip |
|
|
|
PPP-CONTSCPt |
0.2 |
13 |
Nanosensors |
▪ Contact cantilever with higher Q factor for Conductive AFM
▪ Electrically conductive tip, Coated with Pt-Ir |
|
|
|
Platinum |
0.2 |
13 |
- |
▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA |
|
|
|
NSC18/Cr-Au |
3.5 |
75 |
Mikromasch |
▪ Contact cantilever for Conductive AFM, Backside reflex coating
▪ Electrically conductive tip, Coated with Cr-Au |
|
|
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
NSC14/Cr-Au |
5 |
160 |
Mikromasch |
▪ Cantilever with lower force constant for EFM
▪ Conductive tip for electrical application, Coated with Cr-Au |
|
|
|
PPP-NCSTAu |
7.4 |
160 |
Nanosensors |
▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Au |
|
|
|
PPP-EFM |
2.8 |
75 |
Nanosensors |
▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Pt-Ir |
|
|
|
CDT-CONTR |
0.2 |
13 |
Nanosensors |
▪ Contact cantilever for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip |
|
|
|
CDT-NCHR |
42 |
330 |
Nanosensors |
▪ Cantilever with high resonant frequency for DC-EFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip |
|
|
|
NSC36/Cr-Au |
0.95
1.75
0.6 |
105
155
75 |
Mikromasch |
▪ Contact cantilever for EFM, 3 cantilevers on a chip
▪ Conductive tip for electrical application, Coated with Cr-Au |
|
|
|
Multi75E |
3 |
75 |
Budget Sensors |
▪ Cantilever with lower force constant
▪ Conductive tip for electric application, Coated with Cr-Pt |
|
|
|
Platinum |
18 |
14 |
- |
▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA |
|
|
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
PNP-DB |
0.48 0.06 |
67 17 |
Nanoworld |
▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 cantilevers on a chip |
|
|
|
PNP-TR |
0.32 0.08 |
67 17 |
Nanoworld |
▪ Contact cantilever made of Silicon Nitride, Backside reflex coating
▪ 2 triangular cantilevers on a chip |
|
|
|
PPP-CONTSCAuD |
0.2 |
23 |
Nanosensors |
▪ Contact cantilever with higher Q factor
▪ Backside reflex coating with Au |
|
|
|
BL-RC150VB |
0.03 0.006 |
37 13 |
Olympus |
▪ Optimized for F-d spectroscopy measurement, Backside reflex coating
▪ 2 cantilevers on a chip |
|
|
|
DNP-S |
0.175 0.06 0.12 0.03 |
50 16 40 12 |
Bruker |
▪ Contact cantilever for imaging biological samples
▪ 4 triangular cantilevers on a chip |
|
|
|
NSC36 |
0.95 1.75 0.6 |
105 155 75 |
Mikromasch |
▪ Contact cantilever, Backside reflex coating
▪ 3 cantilevers on a chip |
|
|
|
OMCL-TR800PSA |
0.38 0.73 0.05 0.10 |
68 71 18 19 |
Olympus |
▪ Contact cantilever for imaging soft biological samples
▪ Backside reflex coating |
|
|
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
PPP-MFMR |
2.8 |
75 |
Nanosensors |
▪ Cantilever for MFM, Backside reflex coating
▪ Tip is coated with hard magnetic material |
|
|
|
PPP-LC-MFMR |
2.8 |
75 |
Nanosensors |
▪ Cantilever for MFM, Backside reflex coating
▪ Tip is coated with soft magnetic material |
|
|
|
PPP-LM-MFMR |
2.8 |
75 |
Nanosensors |
▪ Cantilever for MFM, Backside reflex coating
▪ Tip is coated with magnetic material of reduced magnetic moment |
|
|
|
SSS-MFMR |
2.8 |
75 |
Nanosensors |
▪ Cantilever for high resolution MFM, Backside reflex coating
▪ Sharp tip of the radius less than 15 nm is coated with magnetic material |
|
|
|
NSC18/Co-Cr |
3.5 |
75 |
Mikromasch |
▪ Cantilever for MFM
▪ Tip is coated with Co-Cr |
|
|
|
NSC19/Co-Cr |
0.6 |
80 |
Mikromasch |
▪ Cantilever with lower force constant for MFM
▪ Tip is coated with Co-Cr |
|
|
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
PPP-EFM |
2.8 |
75 |
Nanosensors |
▪ Cantilever with lower force constant, REQUIRES Ceramic chip carrier
▪ Conductive tip for electric application, Coated with Pt-Ir |
|
|
|
Platinum |
18 |
14 |
- |
▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA |
|
|
| Probe |
Force Constant
(N/m) |
Frequency
(kHz ) |
Manufacture |
Short Description
(Click Probe for detailed specification) |
Quote |
|
DT-NCHR |
42 |
330 |
nanosensors |
▪ Cantilever with high force constant for Lithography, Backside reflex coating
▪ Diamond-coated tip, REQUIRES Teflon-coated chip carrier |
|
|
|
Multi75E |
3 |
75 |
Budget Sensors |
▪ Cantilever with lower force constant, REQUIRES Teflon-coated chip carrier
▪ Conductive tip for electric application, Coated with Cr-Pt |
|
|
|
CDT-CONTR |
0.2 |
13 |
Nanosensors |
▪ Contact contact cantilever for Lithography based on oxidation, Backside reflex coating
▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip carrier |
|
|
|
CDT-NCHR |
42 |
330 |
Nanosensors |
▪ Cantilever with high resonant frequency for Lithography, Backside reflex coating
▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip carrier |
|
|
|
Platimum |
18 |
14 |
- |
▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA |
|
|
|
|
Research
AFM
