Please join us for two interactive Park AFM webinar sessions to learn more about the breaking technologies at Park Systems.

The webinar will cover two topics as below.
Part 1. Park NX20: The Most Accurate AFM for Failure Analysis (FA) & Quality Assurance (QA)
Part 2. Park SICM: Single Live Cell Imaging With Park Scanning Ion Conductance Microscopy

The first session will walk you through the next generation AFM advances in Park NX20, talk to you about our Park nano technology solution to your application needs, and show you an overview of the technology behind Park NX20.

The second session will cover the technology of single live cell imaging with Park scanning probe microscopy.

Do not miss these great opportunities to meet the technical experts from Park during the webinar session. At the end of the presentation, you will have an opportunity to ask questions you may have specific to your application.

  * China and Japan: Part 1. Park NX20 session will be presented only.

 Upon your registration, you will receive a confirmation email with the login details.

System Requirements
PC-based attendees
Required: Windows® 7, Vista, XP or 2003 Server

Macintosh®-based attendees
Required: Mac OS® X 10.5 or newer

For any questions, please contact sj.kim@parkAFM.com