AFM Enthusiasts! Park Systems takes pride in leading innovations in AFM Technology.  From the first commercial AFM to developments in scanning ion conductance and 3D metrology measurements, Park Systems is driven to provide their customers with the latest equipment to push the envelope of science.  Come and visit us at the 2011 MRS Spring Meeting in San Francisco (booth 520) from April 25th to 29th where we are introducing the new XE-100Plus.  With the addition of a motorized sample stage for Step-and-Scan Automation and improved drift rates, the XE-100Plus is our flagship AFM.  All XE-series of products feature artifact free imaging by Crosstalk Elimination (XE), True Non-Contact mode, and the ultimate in AFM resolution.  Learn about what makes Park Systems a long standing establishment in the AFM community. Print this message, fill out a survey, and receive a 100% Silicone ball-point pen.  We look forward to meeting you at the MRS Spring Meeting 2011!

Park Systems Inc., 3040 Olcott Street, Santa Clara, CA 95054 408-986-1110