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Since its inception in the late 1980s, Scanning Ion Conductance Microscopy (SICM) has exploded in popularity largely due to both its ability to operate in relevant solution environments as well as the image resolution it can attain in such conditions. In this tutorial, Prof. Baker will discuss the history of SICM, its various feedback modes, the advantages of each one, and where SICM might be going in the future. About Prof. Lane Baker Prof. Lane Baker, the James F. Jackson Associate Professor of Chemistry at Indiana University, received a B.S. degree from Missouri State University in 1996. He was awarded his Ph.D. degree at Texas A&M University in 2001 working with Richard M. Crooks. He was then awarded a National Research Council Postdoctoral Associateship to study scanning probe microscopes with Lloyd J. Whitman at the Naval Research Laboratory in Washington, D.C. He studied nanopore membranes and single nanopore platforms as a postdoctoral associate with Charles R. Martin at the University of Florida.

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