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As critical dimensions shrink and device complexity increases, the quality of your data is critical for the success of your research, analysis, and ultimately device yield. The key to quality results is accuracy at the nanoscale. Park NX20, the world's most accurate AFM for FA and QA, is the only high-end, large-sample AFM with non-contact mode for preserving tip sharpness. Park NX20 provides the highest accuracy and repeatability for roughness measurements and defect review. Park NX20 offers the highest productivity and the industry's lowest AFM lifecycle costs by dramatically lowering tip costs by extending tip lifetime. The result is a total AFM solution for FA and QA that meets accuracy, productivity and budgetary needs.

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