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SThM

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc. are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The peformance of probes ordered from other sources are not guaranteed.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
NanoThermal-10 0.25   Kelvin Nanotechnology ▪ Cantilever with thermo-coupled tip for SThM
▪ Tip made of NiCr and Pd
▪ Mounted type only
▪ Package of 10 (EA)
Request for Quote
Probe base 2mm x 3mm
Cantilever (Silicon Nitride) 150μm x 60μm x 0.4um
Resistor metal 5nm NiCr + 40nm Pd
Track and pad metal 5nm NiCr + 140nm Au
Resistance 250-400Ω (Typ 320Ω)
Tip Radius <= 100nm
Tip height ~ 10 um
Tip Radius <= 100nm
Current max 2.2 ~ 2.4 mA dc
(recommended)
Spring constant 0.25 N/m (modelled)
Scanning Mode Contact
Sensitivity approx 1Ω / degC
Series resistors 2 x 100 Ω (± 25 Ω)
NanoThermal-5 0.25   Kelvin Nanotechnology ▪ Cantilever with thermo-coupled tip for SThM
▪ Tip made of NiCr and Pd
▪ Mounted type only
▪ Package of 5 (EA)
Request for Quote
Probe base 2mm x 3mm
Cantilever (Silicon Nitride) 150μm x 60μm x 0.4um
Resistor metal 5nm NiCr + 40nm Pd
Track and pad metal 5nm NiCr + 140nm Au
Resistance 250-400Ω (Typ 320Ω)
Tip Radius <= 100nm
Tip height ~ 10 um
Tip Radius <= 100nm
Current max 2.2 ~ 2.4 mA dc
(recommended)
Spring constant 0.25 N/m (modelled)
Scanning Mode Contact
Sensitivity approx 1Ω / degC
Series resistors 2 x 100 Ω (± 25 Ω)


 

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