Probe Store - SCM
For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc. are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The peformance of probes ordered from other sources are not guaranteed.
|Probe||Force Constant (N/m)||Frequency (kHz )||Manufacture||Short Description||Quote|
|PPP-EFM||2.8||75||Nanosensors||▪ Cantilever with lower force constant, REQUIRES Ceramic chip carrier
▪ Conductive tip for electric application, Coated with Pt-Ir
The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a more reproducible tip radius as well as a more defined tip shape. The minimized variation in tip shape provides more reproducible images.
The PPP-EFM probe is offered for electrostatic force microscopy. An overall metallic coating (PtIr5) on both sides of the cantilever increasing the electrical conductivity of the tip. The force constant of this type is specially tailored for the electrostatic force microscopy yielding very high force sensitivity while simultaneously enabling tapping mode and lift mode operation.
|25Pt300B||18||14||Rocky Mountain Nanotechnology||▪ Contact cantilever for conductive AFM(CP-AFM)/SCM
▪ Solid platinum tip
▪ Recommended for high voltage/current application above ±10 V or 1 µA
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type chip carrier
The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.