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Probe Store - Conductive AFM / VECA / ULCA

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
CDT-CONTR 0.2 13 Nanosensors ▪ Contact cantilever for Conductive AFM, Backside reflex coating
▪ Electrically conductive diamond-coated tip, REQUIRES Teflon-coated chip
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NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29
PPP-CONTSCPt 0.2 13 Nanosensors ▪ Contact cantilever with higher Q factor for Conductive AFM
▪ Electrically conductive tip, Coated with Pt-Ir
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The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 23 1 - 57
Platinum 18 14 - ▪ Contact cantilever made of solid platinum
▪ Recommended for high voltage/current application above ±10 V or 1 µA
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The solid platinum probe, whose tip radius is smaller than 20nm, shows better performance than a typical metal-coated probes.

Technical Data Nominal Value Specified Range
Width (µm) 100 90 - 110
Length(µm) 300 250 – 350
Force Constant(N/m) 18 10.8 -25.2
Resonance Frequency (kHz) 14 9.8 – 18.2
NSC18/Cr-Au 3.5 75 Mikromasch ▪ Contact cantilever for Conductive AFM, Backside reflex coating
▪ Electrically conductive tip, Coated with Cr-Au
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Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
NSC18/Cr-Au 60 75 90 1.2 2.8 5.5 225 27.5 3.0


 

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