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  • Park AFM
    Modes and Techniques
    Get the data you need with Park’s selection of scanning modes

Park AFMs feature a comprehensive range of scanning modes so you can collect a wide array of data types accurately and efficiently. From the world’s only true non-contact mode that preserves tip sharpness and sample integrity to advanced Magnetic Force Microscopy, Park offers the most innovative, accurate modes in the AFM industry.

  • imaging-mode
  • electrical-characterization-mode
  • mechanical-characterization-mode
  • functional-characterization-mode
  • True Non-Contact™ Mode Contact Mode Phase Imaging
  • QuickStep™ SCM PinPoint™ Conductive AFM Conductive AFM I-V Spectroscopy Electric Force Microscopy Scanning Kelvin Probe Microscopy Piezoelectric Force Microscopy Dynamic Contact EFM Piezoelectric Response Spectroscopy Scanning Capacitance Microscopy Spreading Resistance Microscopy Scanning Tunneling Microscopy Scanning Tunneling Spectroscopy Time-Resolved Photocurrent Mapping
  • PinPoint™ Nanomechanical Mode Force Distance Spectroscopy Force Volume Imaging Force Modulation Microscopy Lateral Force Microscopy Nanolithography Nanoindentation Spring Constant Calibration
  • Scanning Thermal Microscopy Magnetic Force Microscopy Tunable Magnetic Field MFM Chemical Force Microscopy Electrochemical Microscopy

Park AFM Modes & Technique | Park Atomic Force Microscope