Park AFMs feature a comprehensive range of scanning modes so you can collect a wide array of data types accurately and efficiently. From the world’s only true non-contact mode that preserves tip sharpness and sample integrity to advanced Magnetic Force Microscopy, Park offers the most innovative, accurate modes in the AFM industry.
- True Non-Contact™ Mode Contact Mode Phase Imaging
- QuickStep™ SCM PinPoint™ Conductive AFM Conductive AFM IV Spectroscopy Electric Force Microscopy Scanning Kelvin Probe Microscopy Piezoelectric Force Microscopy Dynamic Contact EFM Piezoelectric Response Spectroscopy Scanning Capacitance Microscopy Spreading Resistance Microscopy Scanning Tunneling Microscopy Scanning Tunneling Spectroscopy Time-Resolved Photocurrent Mapping
- PinPoint™ Nanomechanical Mode Force Distance Spectroscopy Force Volume Imaging Force Modulation Microscopy Lateral Force Microscopy Nanolithography Nanoindentation Spring Constant Calibration
- Scanning Thermal Microscopy Magnetic Force Microscopy Tunable Magnetic Field MFM Chemical Force Microscopy Electrochemical Microscopy