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  • Park-NX12
    Atomic Force Microscope
    The most versatile AFM
    for analytical and electrochemistry

Park NX12

A versatile microscopy platform for analytical chemistry researchers and shared user facilities

  • Atomic Force Microscopy (AFM) for nanometer resolution imaging with electrical, magnetic, thermal, and mechanical property measurement capabilities
  • Pipette-based scanning system for high resolution Scanning Ion Conductance Microscopy (SICM), Scanning Electrochemical Microscopy (SECM), and Scanning Electrochemical Cell Microscopy (SECCM)
  • Inverted Optical Microscopy (IOM) for transparent material research and fluorescence microscopy integration


Proven Park NX10 performance Equipped with Inverted Optical Microscopy

Park NX12 couples the versatility and accuracy of Park’s AFM with a sample stage for inverted optical microscopy. This enables the study of electrochemical properties in samples that are transparent, opaque, soft or hard.


The perfect platform for fundamental electrochemistry

The study of the electrochemistry of batteries, fuel cells, sensors, and corrosion is a rapidly growing field, yet many AFMs do not directly address its unique needs. Park NX12 offers the functionality and flexibility chemistry researchers require by giving them one simple, easy-to-use platform with all the tools they need including:

  • Versatile and easy-to-use electrochemistry cellsM
  • Environmental control options for inert gas and humidity
  • Inverted optical microscope (IOM)
  • Bi-potentiostat compatibility


Researchers can utilize the Park NX12 platform for various electrochemical applications:

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Electrochemical Cell Microscopy (SECCM)
  • Electrochemical Atomic Force Microscopy (EC-AFM) and Electrochemical Scanning Tunneling Microscopy (EC-STM)

Easy optical access with motorized focus stage

    The system allows for top, side, and bottom optical access to the probe from various angles during measurements. This broad optical access combined with the device’s modular design also allows for the addition of optical or nano-optical add-ons.




Built with multi-user facilities in mind

Park NX12 was built from the ground up to accommodate the needs of multi-user facilities. Other AFM solutions lack the required versatility to address the diverse needs of users in these facilities, making it difficult to justify the equipment cost. The Park NX12, however, is built to accommodate standard ambient AFM, in-liquid SPM, optical, and nano-optical imaging, making it one of the most flexible AFMs available.


A modular platform for shared user facilities

  The Park NX12 is an Atomic Force Microscopy platform specifically tailored to address the needs of analytical and electrochemistry researchers as well as those working in shared use facilities.

  It provides a versatile solution for SPM based characterization of chemical and electrochemical properties and surface characterization in both air and liquid media for a broad range of opaque and transparent materials.

  The Park NX12 is easy to use for pipette based SPM techniques with broad visual optical access to the scanning probe.

  The Park NX12’s reasonable price and unparalleled accuracy makes it the ideal platform for multi-user facilities as well as early career researchers.



Multiple Applications

The Park NX12 can serve a wide range of functions, including PinPoint™ in-liquid and nanomechanical mapping, inverted optical microscopy to locate transparent samples, SICM for imaging ultra-soft samples, and enhanced vision to improve optics for transparent samples.





Comprehensive force spectroscopy solution

The Park NX12 provides a complete package for nanomechanical characterization in-liquid and in-air, making it ideal for a wide range of applications.



We make it easy to modify the Park NX12 to suit the unique needs of your lab by installing optional hardware and software add-ons even after installation.


Park SmartScan™ makes scanning fast and simple

The Park NX12 is equipped with our SmartScan™ OS, making it one of the easiest to use AFMs in the market. With an intuitive but extremely powerful interface, even untrained users can quickly scan a sample without supervision. This lets senior researchers focus their experience on solving bigger problems and developing better solutions.


Shared labs often have users from a wide range of backgrounds and experience levels. The NX12 can accommodate every user with its simple point and click interface and automated SmartScan™ mode.





A wide range of environment control options including versatile electrochemistry cells, temperature stage, and glovebox with humidity control.

  Electrochemistry cells

• Electrochemistry cell
• Electrochemistry toolkit for universal liquid cell

  Electrochemistry options

• Potentiostat
• Bi-potentiostat

  Environmental Control Options

• Glovebox
• Live cell chamber

  Temperature Controlled Stages

• Temperature controlled stage (-25 ~180 ºC)
• 250 ºC heating stage
• 600 ºC heating stage

  Magnetic Field Generator

• Applies external magnetic field
  parallel to sample surface
• Tunable magnetic field
• Range: ~ 300 gauss

  Z Scanner Heads

• 15 μm Z Scanner AFM head
• 30 μm Z Scanner AFM head
• 15 μm Z Scanner SICM module
• 30 μm Z Scanner SICM module

  In-Liquid Imaging Options

• Liquid probe hand
• Open liquid cell
• Universal liquid cell

  Acoustic Enclosure

• Stand alone type AE 204
• Stand alone type AE 301

  Clip-type Chip Carrier

• Can be used with unmounted cantilever
• Tip bias function available for conductive AFM and EFM
• Tip bias range: -10 V ~ 10 V

  Starter kits for advanced modes

• Easy to use for advanced modes
• Includes specialized probes and samples



XY scanner range: 100 μm × 100 μm
AFM head Z scanner range: 15 μm, (optional 30 μm)
SICM head Z scanner range: 15 μm, (optional 30 μm)


ADC: 18 channels
24-bit ADCs for X, Y, and Z scanner position sensor

DAC: 17 channels
20-bit DACs for X, Y, and Z scanner positioning

3 channels of integrated lock-in amplifier
Spring constant calibration (Thermal vibration method)
Digital Q control


Basic modes: True Non-contact™ mode, Tapping mode, and Phase imaging, Contact mode and LFM, PinPoint™ imaging, F/D spectroscopy, Force volume imaging, MFM, Enhanced EFM (Basic EFM, DC-EFM, PFM and SKPM), FMM, Nanoindentation

NX option modes: CP-AFM Options (Basic CP-AFM, ULCA, VECA, SSRM), High Voltage option, SCM, SThM, STM

Vision (AFM)

Direct on-axis vision of sample surface and cantilever 
Field-of-view: 840 μm × 630 μm (with 10× objective lens)
Camera: 5 M Pixel (default), 1 M Pixel (optional)

Objective lens
10x (NA. 0.23) ultra-long working distance lens
20x (NA. 0.35) high-resolution, long working distance lens

Software - Park SmartScan™

• AFM system control and data acquisition software
• Auto mode for quick setup and easy imaging
• Manual mode for advanced use and finer scan control

Software - XEI

• AFM data analysis software
• Stand-alone design—can install and analyze data away from AFM
• Capable of producing 3D renders of acquired data

Inverted Optical Microscopy

Objective lens: up to 100x
Fluorescence microscopy* (optional)
Confocal microscopy* (optional)

Park NX12 GloveBox

GloveBox (Optional)

• Allows precise control over the humidity
• Makeup of specified gaseous environments
• Allowing you to insulate highly reactive materials


Dimensions in mm

NX12 Dimensions

Park NX12