|Contact Us
  • Park AFM
    Innovative Technology
 

True Sample Topography

Accurate Sample Topography Measured by Low Noise Z Detector

True Sample Topography™ without piezo creep error

Our AFMs are equipped with the most effective low noise Z detectors in the field, with a noise of .02 nm over large bandwidth. This produces highly accurate sample topography, no edge overshoot and no need for calibration. Just one of the many ways Park AFMs saves your time and give you better data.

  • Low noise Z detector signal is used for Topography
  • Low Z detector noise of 0.02 nm over large bandwidth
  • No edge overshoot at the leading and trailing edges
  • Calibration needs to be done only once at the factory

Park NX AFM

no-creep-effect

Conventional AFM

creep-effect
 

True Sample Topography