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Z scanner heads

Park Systems has developed a range of Z scanner heads that help to make Park AFMs the world’s most accurate. All of our heads feature:

LD and SLD  for better cantilever deflection detection

Our heads use Laser Diode (LD) and Super Luminescence Diode (SLD) to give the most accurate cantilever deflection detection available.

Independent Z-Scan range selection

Because our heads separate the XY scanner from the Z scanner, you have complete control over the Z scan range. 

 

Standard NX AFM Head

The standard NX AFM head is a high speed Z scanner with 15 µm scan range. It is our default head for all of the NX-series AFMs.

Standard-NX-AFM-Head

Specifications :

Z scan range: 15 µm
Resonant frequency of Z-scanner: > 9.5 kHz
Laser type: Super-Luminescence Diode (830 nm)
Noise floor: < 0.05 nm (typically 0.02 nm)
 

Long Travel NX AFM Head

The long travel NX AFM head gives extended Z scan range capability to the NX series of AFMs.

Specifications :

Z scan range: 30 µm
Resonant frequency of Z-scanner: > 2.0 kHz
Laser type: Super-Luminescence Diode (830 nm)
Noise floor: < 0.05 nm (typically 0.02 nm)
*Incompatible with Conductive AFM, SCM, and SThM mode.
 

Standard XE Head

Our standard XE head is the ideal for most uses and works with all standard and the advanced modes for XE-series AFMs.

Standard-XE-Head

Specifications :

Z scan range: 12 µm
Resonant frequency of Z-scanner: > 3 kHz
Laser type: LD (650 nm) or SLD (830 nm), standard
Noise floor: < 0.02 nm (typical), 0.05 nm (maximum)
 

25um XE Head

Give your XE series AFM an extended scanning range with the 25 µm Z-scanner. This head is perfect for high aspect ratio samples such as optical lenses and MEMS device. The head is fully compatible with all basic and advanced modes and options.

Specifications :

Z scan range: 25 µm
Resonant frequency: > 1.7 kHz
Laser type: LD (650 nm) or SLD (830 nm)
Noise floor:  0.03 nm (typical), 0.05 nm (maximum)
 

XE Optical Head

The XE Optical Head lets you use the cantilever of the AFM for light amplification when combined with Raman spectroscopy, enhancing the optical response of the sample. The XE Optical Head provides wide optical accessibility from top, bottom, and side to deliver the best possible beam. This option is compatible with all the options of XE-series AFM.

XE-10nm-Optical-Head

Specifications :

Optical accessibility: top and side
Z scan range
: 12 µm or 25 µm
Resonant frequency: 3 kHz (12 µm XE Head), 1.7 kHz (25 µm XE Head)
Laser type: LD (650 nm) or SLD (830 nm)
Noise floor: 0.03 nm (typical), 0.05 nm (maximum)
 

Hysitron Triboscope Adaptor Head

This adaptor head lets you integrate the Triboscope nanoindenter by Hysitron, Inc. with the XE-series of AFMs. The high feedback performance of the Z-scanner enables precise nanoindentation measurements.

Hysitron-Triboscope-Adaptor-Head

Specifications :

Adaptor to combine with Triboscope nanoindenter of Hysitron, Inc. with the XE-Series
Z scan range
: 12 µm or 25 µm
Resonant frequency: 3 kHz (12 µm XE Head), 1.7 kHz (25 µm XE Head)
Vertical drift rate: < 1 nm/min
 

Z scanner heads