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Park Systems  Webinar -  July 28, 2017

 

Join us for a webinar to learn about one of the cutting-edge applications of nanoscientific research:

PinPoint Nanomechanical Imaging Using Probes of Various Cantilever Stiffness


 The applications staff of Park Systems is proud to present a look at our PinPoint Nanomechanical Mode atomic force microscopy imaging technology using cantilever probes of various stiffness values.

PinPoint Nanomechanical mode obtains the best of resolution and accuracy for nanomechanical characterization. Stiffness, elastic modulus, adhesion force are acquired simultaneously in real-time. While the XY scanner stops, the high speed force-distance curves are taken with well defined control of contact force and contact time between the tip and the sample. Due to controllable data acquisition time, PinPoint™ Nanomechanical mode allows optimized nanomechanical measurement with high signal-to-noise ratio over various sample surfaces.

Join us as Dr. Wenqing Shi, Applications Scientist here at Park Systems, gives an overview of PinPoint Nanomechanical Mode, the effects of using probes with cantilevers of various stiffness values, and review nanomechanical characterization data taken from real-world samples.

170525-pinpoint-nanomechanical-mode
PinPoint Nanomechanical Mode is a new atomic force microscopy-based method that can acquire a quantifiable elasticity map at a dramatically faster rate than traditional force-volume spectroscopy techniques without sacrificing resolution.
  
Register by clicking session below:

Friday, July 28, 2017

ONLINE REGISTRATION PAGE

  • PDT (UTC-7): 11:00 AM - 12:00 PM
  • EDT (UTC -4): 2:00 PM - 3:00 PM 
  • BST (UTC): 7:00 PM - 8:00 PM
  • CEST (UTC +1): 8:00 PM - 9:00 PM
 
 
 
Webinar Details

Date:
Friday, July 28, 2017

Time:

11:00 am – 12:00 pm (PDT)
San Francisco, Los Angeles

2:00 pm – 3:00 pm (EDT)
Boston, New York

7:00 pm – 8:00 pm (BST)
London

8:00 pm – 9:00 pm (CEST)
Paris, Rome

Register Now!

 

170525-adhesive-system

Adhesive System
A 30 um x 30 um scan of an adhesive sample taken at 0.23 Hz with PinPoint Nanomechanical Mode using a Park NX10 AFM system.
 
 
 

 

System Requirements

GoToMeeting

PC-based attendees
Windows XP, Windows Server 2008 or later Server 

Mac-based attendees
MacOS 10.8
or later

 

Park Lectures - Park Atomic Force Microscope