|Contact Us  Global

Technical Articles

9, Dec 14'
Category: Technical Articles
Changing the Future of Nanometrology for the Semiconductor Industry   Abstract The Three-Dimensional Atomic Force Microscopy (3D AFM) by Park ...
26, Dec 13'
Category: Data Storage
AFM Metrology Considerations of Hard Disk Manufacturing Why Atomic Force Microscope? As the design rule becomes smaller, traditional metrology too...
8, Dec 14'
Category: Semiconductor
Reduces Cost and Increases Efficiency in Production of Semiconductor Wafers   Introduction The scaling trend in semiconductor design requires ...
26, Dec 13'
Category: Data Storage
Programmable Data Density (PDD) for High Throughput Feature Measurement Park Systems, the Nanotechnology Solutions Partner for HDD Industry ...
14, Jul 14'
Category: Semiconductor
High Throughput Electrical Measurements with No Sacrifice in Signal Sensitivity   Summary With the implementation of QuickStep Scan, the throu...
26, Dec 13'
Category: Data Storage
Automatic Defect Review AFM for Hard Disk Media and Substrates Park Systems, Nanotechnology Solutions Partner for HDD Industry ...
1, Jul 14'
Category: Semiconductor
The scaling trend in semiconductor design requires tighter control over defects on wafers. In order to characterize the defects, both inspection and r...
26, Dec 13'
Category: Data Storage
Patterned Arrays of Magnetic Nanostructures Patterned arrays of magnetic nanostructures have become one of the key issues in recent years becaus...
27, Dec 13'
Category: Data Storage
Undercut Structures and Sidewall Roughness XE-3DM The XE-3DM metrology AFM incorporates the decoupled scanner configuration.   Becaus...
26, Dec 13'
Category: Data Storage
Surface Roughness Measurement of Media and Substrate Surface Roughness Measurement of Media and Substrate Eunji Shin (Industrial Product Managemen...

Park Technical Articles | Park Atomic Force Microscope