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Electrical & Electronics

10, May 17'
Category: Data Storage
The coupling between an electrical and mechanical response in a material is a fundamental property that provides functionality to a variety of applica...
11, Jul 16'
Category: Semiconductor
Semiconductor device dimensions have been moving to 1X-nm node and below for years now in order to continually meet market demand for faster and more ...
10, Mar 17'
Category: Semiconductor
Scanning Kelvin probe microscopy, or SKPM, was introduced as a tool to measure the local contact potential difference between a conducting atomic forc...
14, Jul 14'
Category: Semiconductor
High Throughput Electrical Measurements with No Sacrifice in Signal Sensitivity   Summary With the implementation of QuickStep Scan, the throu...
31, Jan 17'
Category: Data Storage
Magnetization reversal plays a major role in designing the switching mechanisms of magnetic nanostructures in a high density storage device. In this s...
27, Dec 13'
Category: Data Storage
Undercut Structures and Sidewall Roughness XE-3DM The XE-3DM metrology AFM incorporates the decoupled scanner configuration.   Becaus...
28, Dec 16'
Category: Semiconductor
Efforts to harden electronic components and systems using solid-state devices against the effects of radiation and heat for use in space travel has be...
26, Dec 13'
Category: Data Storage
AFM Metrology Considerations of Hard Disk Manufacturing Why Atomic Force Microscope? As the design rule becomes smaller, traditional metrology too...
11, Jul 16'
Category: Semiconductor
Semiconductor devices are the foundation of modern electronics due to their importance in the function of electrical circuitry with components such as...
26, Dec 13'
Category: Data Storage
Programmable Data Density (PDD) for High Throughput Feature Measurement Park Systems, the Nanotechnology Solutions Partner for HDD Industry ...

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