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Workshops

At Park Systems we offer live demos to better show the capabilities and functions of our equipment. Found below is a list of the upcoming demos we are hosting along with links to register for each event.
For further information, click on ‘Details’ for the demo you are interested in. 

160824-park-ud

In proud partnership with the University of Delaware, Park Systems is proud to announce a free workshop and live demo to take place on October 11, 2016 at Brown Laboratory on campus. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

We are no longer accepting registration for this event

Event Date 10-11-2016 10:00 am
Event End Date 10-11-2016 2:00 pm
Individual Price Free

160824-park-njit

In proud partnership with the New Jersey Institute of TechnologyPark Systems is proud to announce a free workshop and live demo to take place on October 6, 2016 at Tiernan Hall and the Otto H. York Center for Environmental Engineering and Science. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

We are no longer accepting registration for this event

Event Date 10-06-2016 10:00 am
Event End Date 10-06-2016 2:00 pm
Individual Price Free

160824-park-taxas-univ

In proud partnership with the University of Texas at Austin and its Texas Materials Institute, Park Systems is proud to announce a free workshop and live demo to take place on October 4, 2016 at the Larry R. Faulkner Nano Science and Technology Building. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

We are no longer accepting registration for this event

Event Date 10-04-2016 10:00 am
Event End Date 10-04-2016 2:00 pm
Individual Price Free

160908-park-rice

In proud partnership with the Rice University, Park Systems is proud to announce a free workshop and live demo to take place on September 28, 2016 at Rice University’s BioScience Research Collaborative. The workshop will cover topics such as AFM automatizing software with Self-Optimizing Scan Control and Scanning Ion Conductance Microscopy (SICM) technology, both from Park Systems. In the subsequent live demo, Park Systems will also unveil the functionality of the Park NX10 SICM System—a tool designed to enable innovative studies in electrochemistry. The entire event is open to all interested parties and includes lunch.

We are no longer accepting registration for this event

Event Date 09-28-2016 10:00 am
Event End Date 09-28-2016 2:00 pm
Individual Price Free

2016-ivc-20-luncheon

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 is hosting a free AFM Luncheon for IVC-20 attendees and Park customers on August 23, 2016 from 12:30-2pm at the Room 206, Bexco. The luncheon will feature talks from Park System CEO Dr. Sang-il Park. Park Systems will exhibit their Atomic Force Microscopes NX10 in booth A-130 at IVC-20, BEXCO.

We are no longer accepting registration for this event

Event Date 08-23-2016 12:30 pm
Event End Date 08-23-2016 2:00 pm
Individual Price Free

Park Workshops | Park Atomic Force Microscope