Join us in Monterey, CA from March 21-23 as FCMN presents the The 2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics at the Monterey Marriott! The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.
- Event Dates : March 21 - 23, 2017
- Venue : Monterey Marriot — Monterey, CA
The conference consists of formal invited presentation sessions and poster sessions for contributed papers. The poster papers cover new developments in characterization and metrology especially at the nanoscale. The conference series began 1995 and is the 11th conference in the series.