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ipfa-invitation

Join us from July 18 to July 21, 2016 in Singapore at our booth on the exhibit floor at the Marina Bay Sands as we present the latest advances in our atomic force microscopy products and services. Our friendly staff will be on hand to discuss a solution for your specific nanometrology challenge and detail why and how Park AFM can assist you with tackling your specific application.

 

l  Event Dates : July 18 – 21 , 2016

l  Venue : Marina Bay Sands, 10 Bayfront Avenue, Singapore 018956

l  Park’s Booth : A13

 

About IPFA West:

The 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2016) is organized by the IEEE Reliability/CPMT/ED Singapore Chapter. The Symposium is technically co-sponsored by the IEEE Electron Device Society and IEEE Reliability Society.
IPFA 2016 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.

l  Link : http://ieee-ipfa.org/2016/home

Exhibitions