Park Systems is proud to announce that it will be attending the 42nd International Symposium for Testing and Failure Analysis (ISTFA) being held from November 6 to 10 this year! Come meet our staff at the Forth Worth Convention Center in Fort Worth, TX when the event's exhibition space opens on November 8 to 9.
Organized by the Electronic Device Failure Analysis Society (EDFAS), an ASM International Affiliate Society, ISTFA has become a premier event for engineers and other members of the failure analysis community to explore the latest research and tools available to facilitate their work.
- Event Dates : November 6 – 10, 2016 (Exhibit: November 8 - 9)
- Venue : Fort Worth Convention Center — Fort Worth, TX
- Park’s Booth : 101
Failure analysis is a critical element of the electronics industry. However, it's also a diverse combination of electronics and materials analysis. Because no existing society was suited to meet the specific needs of our technical community, scientists and engineers who perform failure analysis on electronic devices have never enjoyed representation in terms of a dedicated, focused society.
In 1998, considerable effort by the Steering Committee of the International Symposium for Testing and Failure Analysis (ISTFA) resulted in a recommendation to the ASM Board of Trustees: that a new ASM Affiliate Society be chartered to serve the specific needs of the electronic device failure analysis community. Hence, the ASM Electronic Device Failure Analysis Society, or EDFAS, was formed.