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ChinaNANO 2013 Exhibition

Please join us for a nanoscale exploration with Park Systems at the Beijing International Convention Center. We will present the latest advances in microscopy followed by a demo of the Park NX10, the newly launched next-generation AFM (atomic force microscope).

Date / Time


Sang-il Park’s Presentation

Sep 5 ~ 7, 2013

Sep 6, 2013 (10:05 ~ 10:25 am)


Beijing International Convention Center

Booth #

# 233


sangilparkDr. Sang-il Park, founder and CEO of Park Systems, will give an oral presentation during session 9 (Nanocharacterization and Metrology) of ChinaNANO2013. Hispresentation, entitled "Evolution of atomic force microscopy: from a tool for nano-science to a system for nano-industry", will cover the history and characteristics of AFM, and various types of AFM developed by Park Systems.This includes AFM’s pros and cons, its advancement from piezo-tube scanners, AFM’s evolution to an ideal methodology for non-destructive sample scan with longer tip life, and new AFM platform capability to enable the capture of images in 3D withscanning ion conductance microscopy (SICM) for single live cell imaging


 2013 is intended to stimulate discussions on the forefront of research in nanoscience and nanotechnology. The conference will focus on inorganic nanomaterials and MOFs, carbon nanomaterials, soft nanomaterials, nanocomposites and applications, energy and environmental nanotechnology, nanophotonics and optoelectronics, nanodevices and nanosystems, nanobiotechnology and nanomedicine, nanocharacterization and metrology, as well as modeling and simulation of nanostructures. We sincerely hope that the scope of the conference will serve the interest of the scientific community, as well as the industry and the general public. I wish to extend my welcome to all participants and sponsors of the event.