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Our Story

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The longest technology history

More than a quarter century ago, the foundations for Park Systems were laid at Stanford University where Dr. Sang-Il Park, the founder of Park Systems worked as an integral part of the group that first developed AFM technology. After perfecting the technology, he then went on to create the first commercial AFM and later Park Systems was born. 

2013

Park NX-HDM: Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substratesnx-hdm.jpg

 

2012

Park NX20: World's Most Accurate AFM for FA Labspark-nx20.jpg

 

2011

Park NX10: Flagship AFM of New Product Line with True Sample Topography™park-nx10.jpg

2009

XE-Bio:New Bio AFM for Live Cell Imaging with Scanning Ion Conductance Microscopyxe-bio.jpg

 

2008

XE-3DM:New 3D AFM for High Resolution 3D Metrologyxe-3dm.jpg

 

2004

True Non-Contact Mode™ for Non-destructive Sample Scan

 

 

2002

Crosstalk Eliminated(XE) AFM for Flat and Linear XY Scan

 

 

1989

The World's First Commercial AFM (Park Scientific Instruments)
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1985

Invention of AFM(Stanford Univ.)
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