Santa Clara, CA December 01, 2015
Park Systems, world leader in Atomic Force Microscopy (AFM) announces Park NX10 SICM Module, an add-on scanning ion conductance microscopy module to Park NX10 that is the only product available today that easily integratesthe power of SICM to an AFM.
Park SICM benefits virtually all materials characterization that require measurements in liquid such as hydrogel, live cell, electrochemical reaction, and in-liquid surface charge detection due to the sample's sensitive characteristics to hydration.Park SICM will be first showcased in Boston Nov 30- Dec 4 at The Materials Research Society Fall Meeting in Park System's Booth 1017 and will begin shipping in Dec 2015.
"Park NX10 SICM Module is the only product in the industry that provides the power of SICM with Atomic Force Microscope offering far-reaching research implications across many nanotechnology disciplines," stated Keibock Lee, Park Systems President. "Park SICM advances nano scientific research tremendously for example, by enabling life scientists to image extremely delicate cells such as neuronal cells and measure the cell's tiniest features in its aqueous environment without disturbing it, and doing this at a resolution not previously thought possible."
Park NX10 SICM Module was developed to acquire the morphology of a sample in liquid conditions accurately without making physical contact and causing sample deformation. It uses a nano-pipette as an ionic current sensitive probe to enable in-liquid imaging in a repeatable and reliable manner to visualize materials in hydrated status.
Park SICM is designed to be used for a wide range of scientific research to study materials in hydrated status or in liquid environments including biology and life science researchers who visualize biological materials' physiological status and electrochemistry researchers who characterize surface electrochemical reactions and image them in liquid environment.
Park SICM is also applicable to researchers who have been using pipette-based applications such as nano- injection and –biopsy, patch clamping, scanning electrochemical microscopy (SECM), potential measurement, and surface charge detection. Another application for Park SICM is to allow electro chemistry researchers to view and characterize electrochemical reaction for studies such as battery research.
"Park SICM has very advanced capabilities to help identify morphology in liquid environments with nanoscale accuracy to help researchers understand the physiological phenomenon of materials," statesLane A. Baker, James F. Jackson Associate Professor of Chemistry Indiana University. "Park SICM in liquid imaging is an important advancement for nano scientific research and will be used widely for our research as analytical and materials chemists."
At this year's MRS Fall event, Park Systems will also showcase their complete line of innovative atomic force microscopes including Park NX10, the industry's leading AFM product known for unbeatable nanoscale accuracy and ease-of-use facilitated by Park SmartScan, the only point-and-click imaging system for AFM.
About Park Systems
Park Systems is a world-leading manufacturer of atomic force microscopy (AFM) systems with a complete range of products for researchers and industry engineers in chemistry, materials, physics, life sciences, and semiconductor and data storage industries. Park's products are used by over a thousand of institutions and corporations worldwide. Park's AFM provides highest data accuracy at nanoscale resolution, superior productivity, and lowest operating cost thanks to its unique technology and innovative engineering. Park Systems, Inc. is headquartered in Santa Clara, California with its global manufacturing, and R&D headquarters in Korea. Park's products are sold and supported worldwide with regional headquarters in the US, Korea, Japan, and Singapore, and distribution partners throughout Europe, Asia, and America. Please visit http://www.parkafm.com or call 408-986-1110 for more information.