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Welcome to Park Systems’ Q4, 2011 Newsletter                         tweeterfacebook qrcode-parksystems 
In this issue:
 Featured Product News and Events  Upcoming Exhibitions  Accurate AFM Image                                           

Featured Product

 
NX 10: The World's Most Accurate AFM

The NX10, the world’s most accurate AFM and the flagship AFM of Park Systems’ new product line, brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers. It is the world’s premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. As Park Systems’ most user-friendly AFM, the NX10 makes AFM convenient and intuitive for new and experienced users alike.

Click herefor the detailed product information
Click here to visit the NX promotion site

News and Events

Park Systems Unveils NX10: The World’s Most Accurate AFM

Suwon, Korea, November 11, 2011 – Park Systems has introduced the NX10, the world’s most accurate AFM, as the flagship AFM of its new product line. Now available worldwide, the NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. The NX platform builds on Park Systems’ 28 years of technology leadership in AFM data accuracy, and its reputation as the leading nanotechnology solutions partner to research and industry.  

The NX10 is the world’s premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. As Park Systems’ most user-friendly AFM, the NX10’s next-generation electronics enable one-step automatic operation of sweep, set, and scan, making AFM convenient and intuitive for new and experienced users alike. With industry-leading Z-servo speed, the NX10 improves Park Systems’ True Non-Contact ModeTM for even higher accuracy, faster scan speeds, and longer tip life. The NX10 delivers the fastest scan speeds available for non-contact AFM imaging, enabling unparalleled tip life for the widest range of samples and scan conditions. With the NX10, fast scan rates are realized without compromising measurement accuracy or user productivity, all while minimizing the lifetime tip costs for the instrument. 

With the introduction of the NX10, Park Systems has launched the world’s premium research-grade AFM. The NX10, as well as future products in development under the NX line, address the widest variety of AFM applications and research needs, and enable the next generation of researchers with the world’s most accurate AFM. Technical data and sample measurements are available on request.

Click here for the full news article
Click here to visit the NX promotion site

Hitachi High-Technologies and Park Systems Sign Distribution Agreement for Japan

201111-q4-hitachi-distributionTokyo, Japan and Suwon, Korea, November 1, 2011 – Hitachi High-Technologies, (”Hitachi High-Tech”), a cutting-edge technology company of science & medical systems, and Park Systems, the leading nanotechnology solutions partner for nanoscale measurements, have announced that they have signed a distribution agreement for Japan. 

“We are delighted to have signed this agreement with Park Systems, which will help us expand our offering of value-added and innovative product solutions to the AFM/SPM community in Japan,” said Tsutomu Okada, head of science systems sales and marketing division.  “The Park Systems product line will be an excellent complement to our own extensive range of analytical instruments, including scanning electron microscopes.”

Under this agreement, Hitachi High-Tech is responsible for the marketing and distribution of Park Systems’ complete line of AFMs in Japan.  To enhance application and service support in the Japanese market, Park Systems Japan has expanded its facility and established a new application laboratory which will host a series of research and industrial AFM products with a complete range of modes and options.  Both companies will advance sales promotions by actively sponsoring and presenting at academic conferences and exhibitions.

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 Elexience SA Has Been Appointed as the New Distributor of Park Systems in France

201111-q4-elexience-distributionSuwon, Korea, and Verrieres-le-buisson, France, October 5, 2011- Elexience, the leading distributor of electronic and physical characterization solutions in France, has signed a distribution agreement with Park Systems, the leading nanotechnology solutions partner of nanoscale measurements.  Patrick Quero, general manager of Elexience, said, “AFM is very complementary of our product portfolio that includes electron microscopes. We have a high regard for Park Systems as the leading AFM manufacturer in the field. I am deeply impressed by the enthusiasm of passionate young people at Park Systems. This is something Elexience takes seriously in selecting the product we represent because we as a sales and service company pursue a long and successful business relationship with manufacturers.”

Elexience is based out of Verrieres-le-buisson, France, and was established in 1971. Since then, it has grown to become one of the leading sales and service organization in electronic and physical characterization systems. They will sell, install, and support Park Systems’ complete line of AFMs, including the XE-Bio, the new bio AFM for live cell imaging with Ion Conductance Microscopy (ICM), and the XE-100, the award-winning research-grade AFM with Step-and-Scan Automation.

 
 

Click here for the full news article



Park Systems Japan to Sponsor AFM Bio-Imaging Forum

Tokyo, Japan, November 1, 2011 –Japanese Society of Microscopy has announced that Park Systems Japan will be the sponsor for its upcoming AFM Bio-Imaging Forum. Set to take place at WINC AICHI (room 1303) in Nagoya on Tuesday, December 27th, 2011, the forum will invite leading Japanese scientists and researchers who apply state of the art AFM techniques to study biophysics, biochemistry, and cell biology.   The topical meeting will cover studies of a wide range of biological objects from protein and molecule to tissue and cell, including evaluation of the mechanical property.   

The forum will be divided into two sessions.  In the first session, Prof. Ando of Kanazawa University, Prof. Ogino of Yokohama National University, and Prof. Yamada of Kyoto University will talk about AFM imaging of protein and biomolecule dynamics.  The second session will invite four renowned users of Park Systems’ XE-Bio, Prof. Usukura of Nagoya University, Prof. Ushiki of Niigata University, Prof. Okajima of Hokkaido University, and Prof. Sokabe of Nagoya University, who will present unique bio-imaging results of live cells in liquid, in vitro, with AFM and scanning ion conductance microscope (SICM).   Especially Prof. Sokabe will discuss about SICM’s significance for studies of nanoscale electrophysiology and its future.  Also, Dr. Sang Joon Cho of Park Systems will summarize the recent progress of bio-imaging using AFM/SPM.

Click here for the full news article


 

Upcoming Exhibitions

MRS Fall Meeting, November 29~ December 01, 2011, Boston, USA
Come and visit us at the 2011 MRS Fall Meeting in Boston (Booth #410) from November 29th to December 1st and learn about what makes the NX10 a transformative and category-redefining product. The NX10 is the world's premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimized thermal drift. As Park Systems' most user-friendly AFM, the NX10's next-generation electronics enable one-step automatic operation of sweep, set, and scan, making AFM convenient and intuitive for new and experienced users alike.

ASCB 51th Annual Meeting, December 03~07, 2011, Denver, USA
Park Systems, the leading nanotechnology solutions partner of nanoscale measurements, invites you to visit our booth (#604) at the Annual Meeting for the American Society of Cell Biology (ASCB), to be held in Denver, CO from December 3rd to 7th, 2011.   Come and learn about the XE-Bio, our powerful 3-in-1 research tool that combines the imaging capabilities of AFM, ICM, and optical microscopy for the ultimate in non-invasive in-liquid imaging. The XE-Bio features Ion Conductance Microscopy (ICM) and the industry’s only True Non-Contact AFM on the same inverted optical microscope platform, all with a modular design that allows for easy switching between AFM and ICM. The XE-Bio is ideal for imaging living cells and other biological samples in dynamic conditions, and can be adapted to probe a host of powerful applications in nanoscale electrophysiology. See the latest innovation in live cell imaging and learn about non-invasive, high resolution, in-liquid imaging technique for live cells. 

Semicon Japan 2011, December 07~09, 2011, Chiba, Japan
Park Systems, the leading nanotechnology solutions partner of nanoscale measurements, would like to invite you to visit us at SemiconJapan 2010 (Booth# 5A-203), December7th-9th, 2011 at the Makuhari Messe in Chiba, Japan.   Park Systems, in its continuing efforts to provide our customers with nanometrologysolutions for today’s challenges in device manufacturing, will be featuring a range of automated AFM products for in-line fab. Theexhibition will provide an excellent opportunity to learn about the XE-Wafer, our automated industrial AFM for in-line wafer inspection and metrology of 200 mm and 300 mm wafers, and the XE-3DM, our new 3D AFM for high resolution 3D metrology with patented tilted Z-scan system. The XE-3DM is a breakthrough in high resolution imaging of deep undercut structures and sidewalls. In addition, our True Non-Contact Mode enables non-destructive measurement of soft photoresist surface with high aspect ratio tips.  Come and discover Park Systems’ fully automated AFM solutions for process monitoring and characterization of critical topographies!

 

Accurate AFM Image

The Surface of Anodized Aluminum Oxide

The surface of anodic aluminum oxide is well known for its hexagonally-packed cylindrical pores, with some pore diameters ranging from the 10s to 100s of nanometers. Though most atomic force microscopes (AFMs) can resolve the periodicity of these pores on the aluminum oxide surface, they cannot characterize the shape of each pore, as tip damage due to slow scanner response prevents imaging the bottom of the pore. However, with Park Systems’ tip-preserving True Non-Contact mode, enabled by NX’s high-speed Z servo, researchers can now image the aluminum oxide surface as well as at the bottom of the pores. Scan size: 1 µm.

201111-q4-afm-image-surface-of-anodized-aluminum-oxide

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