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The fastest growing AFM company with the largest resources.

Park Systems strives everyday to live up to the innovative spirit of its beginnings. Throughout our long history, we have honored our commitment to providing the most accurate and yet very easy to use AFMs, with revolutionary features like True Non-Contact™ mode, and many automated software. We are not simply content to rest on our past success. All of our products are designed with same care and creativity that went into our first, allowing you to focus on getting results without worrying about the integrity of your tools.

After over quarter century of continuous growth and product innovation, Park has the longest history of AFM business in the industry. The company has developed a global sales network of over 30 countries and has more than 1000 AFMs in use around the world. It is the fastest growing AFM company with more than 120 full time employees dedicated to producing the most accurate and easiest to use AFMs.


The longest technology history

The foundations for Park Systems were laid at Stanford University where Dr. Sang-Il Park, the founder of Park Systems worked as an integral part of the group that first developed AFM technology. After perfecting the technology, he then went on to create the first commercial AFM and later Park Systems was born. 

Dec 16, 2015

IPO: Park Systems, World Leading Manufacturer of Atomic Force Microscopes with AA Rating Announces One Million Shares in IPO Listing on KOSDAQIPO event


Nov, 2014

Park SmartScan: Professional AFM Images with a Three Step Click SmartScan by Park Systems Revolutionizes Atomic Force Microscopy by Automatizing the Imaging Process User-Friendly-UX



Park NX-HDM: Fully Automated Automatic Defect Review and Sub-Angstrom Surface Roughness for Hard Disk Media and Semiconductor Substratesnx-hdm.jpg


Park NX20: World's Most Accurate AFM for FA Labspark-nx20 - accurate AFM



Park NX10: Flagship AFM of New Product Line with True Sample Topography™park-nx10



XE-Bio:New Bio AFM for Live Cell Imaging with Scanning Ion Conductance Microscopyxe-bio - ion conductance microscopy



XE-3DM:New 3D AFM for High Resolution 3D Metrologyxe-3dm.jpg



True Non-Contact Mode™ for Non-destructive Sample Scan




Crosstalk Eliminated(XE) AFM for Flat and Linear XY Scan




The World's First Commercial AFM (Park Scientific Instruments)




Invention of AFM(Stanford Univ.)


About US | Park Atomic Force Microscope