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Probe Store - Conductive AFM / VECA / ULCA

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc. are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The peformance of probes ordered from other sources are not guaranteed.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
CDT-CONTR 0.5 20 Nanosensors ▪ Contact cantilever for conductive AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Mounted type on Conductive AFM (CP-AFM) Chip Carrier
Request for Quote

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging. For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

Property Nominal Value Specified Range
Thickness /µm 2 1.0 - 3.0
Mean Width /µm 50 42.5 - 57.5
Length /µm 450 440 - 460
Force Constant /(N/m) 0.5 0.1 - 1.7
Resonance Frequency /kHz 20 11 - 29
PPP-CONTSCPT 0.2 25 Nanosensors ▪ Cantilever for DC-EFM/PFM/CP-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Mounted type on Conductive AFM (CP-AFM) Chip Carrier
Request for Quote

The NANOSENSORS™ PPP-CONTSCPt is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 25 1 - 57
25Pt300B 18 20 Rocky Mountain Nanotechnology ▪ Contact cantilever for conductive AFM(CP-AFM)/SCM
▪ Solid platinum tip
▪ Recommended for high voltage/current application above ±10 V or 1 µA
▪ Mounted type on Conductive AFM (CP-AFM) Chip Carrier
Request for Quote
Cantilever Data Nominal Value Specified Range
Tip shank length /µm 80 ± 25%
Cantilever length /µm 300 ± 15%
Cantilever width /µm 110 ± 15%
Spring constant /(N/m) 18 ± 40%
Frequency /kHz 20 ± 30%
Tip radius /µm < 20  
NSC18/Cr-Au 2.8 75 Mikromasch ▪ Contact cantilever for conductive AFM(CP-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Mounted type on Conductive AFM (CP-AFM) Chip Carrier
Request for Quote
Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
60 75 90 1.2 2.8 5.5 225 27.5 3.0


 

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