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Thermal Properties

Park Systems offers a scanning thermal mode that easily measures the thermal properties of a sample. This mode features Park AFM’s trademark accuracy that allows users to collect reliable data.

Scanning Thermal Microscopy (SThM)

The SThM mode of Park AFM allows the user to find the local thermal conductivity of a sample by measuring heat transfer between tip and sample using a micro-fabricated probe.

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Scanning-Thermal-Microscopy
Temperature map of the Pole-Tip-Recession of an active hard disk slider Scan size 20µm x 20µm

Specifications :

Operational modes: Conductivity Contrast Microscopy, Thermal Contrast Microscopy
Tip radius and device material of the probe: 100 nm, NiCr & Pd
Thermal spatial resolution: < 100 nm
Allowable current limit: 1 mA
Operating temperature: up to 160 °C
Temperature resolution: 0.1 °C
Noise level in temperature: 0.05 °C

Park Scanning Probe Microscopy Modes