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Dielectric-Piezoelectric

Park Systems offers a selection of advanced modes that can provide not only topographic imaging but also characterization measurements with respect to the dielectric and piezoelectric property of the sample. These modes include Enhanced Electric Force Microscopy (Enhanced EFM), Dynamic Contact Electric Force Microscopy (DC-EFM), and Piezoelectric Force Microscopy (PFM).

Enhanced Electric Force Microscopy (EFM)

The Enhanced EFM mode of Park AFM offers four separate options: Standard EFM, Dynamic-Contact EFM (DC-EFM), Piezoelectric Force Microscopy (PFM), and Scanning Kelvin Probe Microscopy (SKPM). The movement of a cantilever is influenced by the electric force between cantilever and sample; cantilever displacement can be analyzed for potential, charge, or electric domains.

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Enhanced-Electric-Force-Microscopy

Specifications :

Bias range : - 10 V - +10 V

Dynamic Contact EFM (DC-EFM)*

DC-EFM is capable of extremely high definition EFM results. Patented by Park Systems, DC-EFM actively applies an AC voltage bias to the cantilever and detects the amplitude and the phase change of the cantilever modulation with respect to the applied bias. DC-EFM provides the ability to monitor the second harmonic of the modulation which can be compared to the capacitance of a sample and enhances the electric force signal from the background intermolecular force.

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Specifications :

Bias range : - 10 V - +10 V
AC bias frequency : 0 - 100 kHz (1 Hz frequency resolution)
US Patent No  :  6185991

Piezoelectric Force Microscopy (PFM)*

Park Systems’ patented PFM mode accurately measures electric domain structures such as polarity in ferroelectric or piezoelectric samples. This mode includes independent control of an applied AC and DC bias, and local amplitude/phase vs. DC bias spectroscopy.

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Piezoelectric-Force-Microscopy

Specifications :

AC bias frequency : 0 - 100 kHz
Phase resolution : 0.005°
DC Bias :  - 10 - +10 V (-2kv - +2kV, optional)
US Patent No  : 6185991

Piezoelectric Response Spectroscopy

The Piezoelectric Response Spectroscopy mode of Park AFM measures the local amplitude/phase response to a DC bias between tip and sample surface. The polarity of local piezoelectric domain switches depend on the sign and amount of applied voltage.

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Piezoelectric-Response-Spectroscopy

Specifications :

External high voltage kit required
DC Bias : -2kV ~ +2kV

Park Scanning Probe Microscopy Modes