Mechanical Properties (F-D Spectroscopy)
FD spectroscopy on the Ag particle show aberrations associated with the indentation of the nanoparticle.
FD spectroscopy on the substrate show no effects of indentation.
Relevant Publications using XE-series AFM and F-D Spectroscopy
Qihua Xiong, N. Duarte, S. Tadigadapa, and P. C. Eklund; Force-Deflection Spectroscopy: A New Method to Determine the Young’s Modulus of Nanofilaments; Nano Lett., 2006, 6 (9), 1904-1909
Equipment: Park Systems XE-100
Abstract: We demonstrate the determination of Young's modulus of nanowires or nanotubes via a new approach, that is, force-deflection spectroscopy (FDS). An atomic force microscope is used to measure force versus deflection (F−D) curves of nanofilaments that bridge a trench patterned in a Si substrate. The FD data are then fit to the Euler−Bernoulli equation to determine Young's modulus. Our approach provides a generic platform from which to study the mechanical and piezoelectric properties of a variety of materials at the nanoscale level. Young's modulus measurements on ZnS (wurtzite) nanowires are presented to demonstrate this technique. We find that the Young's modulus for rectangular cross section ZnS nanobelts is 52 ± 7.0 GPa, about 30% smaller than that reported for the bulk.