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Atomic Force Microscope

Powerful AFM/SPM Images Produced by the XE-Series
The XE-Series can perform a full range of both standard and advanced functional SPM modes. Moreover, its versatile and elegant platform can be configured for diverse customized needs while utilizing all the standard XE features and benefits.




Fungus


HD-CD stamp


Laser Zone Texture of HDD ...


Blue LED surface


GaAs IC Chip


Deep trench pattern


Polystyrene latex


Phase Imaging of Block Co-...


Surface of GaN wafer
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Atomic Force Microscope
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