Better accuracy means better data
Park AFM produces data you can trust, replicate, and publish at the highest nano resolution. It features the world’s only true non-contact AFM that prolongs tip life while preserving your sample, and flexure based independent XY and Z scanner for unparalleled accuracy and resolution.
Better accuracy means better productivity
From sample setting to full scan imaging, measurement, and analysis, Park AFM saves you time every step of the way. The user friendly interface, easy laser alignment, automatic tip approach, and analysis software allow you to get publishable results faster.
Better accuracy means better research
With more time and better data, you can focus on doing more innovative research. And the Park AFM’s wide range of measurement modes and customizable design means it can be easily tailored to the most unique projects.
The Most Accurate AFM Solutions for General Research
Park Systems provides not only the most advanced AFMs in the market,
but also the most user-friendly. The easy user interface and the
minimal time and effort required to learn AFM operation reflects
our dedication to user-oriented product development.
The leading nano metrology tool for failure analysis and large sample research
The quickest path to innovative research
The best value research-grade AFM with flexible sample handling
Our flagship AFM with reduced drift rate and the Step-and-Scan Automation
the ultimate AFM/SPM performance in Non-Contact nanoscale metrology
Versatile AFM placed on top of the many popular inverted optical
microscopes with flexible integration for other advanced optical
measurement techniques such as Raman spectroscopy
Park Systems’ large sample AFM with encoded motorized sample
stage and the Step-and-Scan automated sample measurement
Heating and cooling stages for temperature control
Provides controlled atmosphere for the samples sensitive to oxygen