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Application Notes
AFM Technology
How SPM Works
XE Technology
Advanced SPM Modes
Application Notes
References

Data Storage
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Programmable Data Density (PDD) for High Throughput Feature Measurement view
New 3D-AFM for High Resolution Sidewall Imaging view
Automatic Defect Review AFM for Hard Disk Media and Substrates view
Patterned Arrays of Magnetic Nanostructures view
Nanometrology of Magnetic Recording Industry AFM Applications to Tape view

Semiconductors
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Critical Dimension
XE Atomic Surface Profiler
Chemical Mechanical Polishing

Polymer Science
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Polymer Composite
Phase Separation in the Co-Extruded Polymer
Green Chemical Polymer

Biological Science
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Phase Separation in the Co-Extruded Polymer
Mouse Sperm Cells
Liposomes and Vesicles
Lipid Vesicle and Bilayer
Human Astrocytoma Cells
AFM and Confocal Microscopy

General Research
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Atomic Force Microscopy Investigation of 1D Structures Utilizing the XE-series Instruments
Characterization of Epitaxially Grown MnAs Films Using AFM and MFM
Characterization of Organic Photovoltaic Cells
Production and Measurement of Nanodot Array
Surface Morphology of Electrospun Fibers
Surface Topography Considerations Utilizing the XE-series AFM Instruments
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