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Product
Research
XE-70
XE-100
XE-150
XE-200
XE-Bio
XE-NSOM
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Modes
Industrial
XE-3DM
XE-CMP
XE-HDM
XE-LCD
XE-PTR
XE-WAFER




XE-70
Affordable, Research-Grade AFM with Flexible Sample Handling

XE-100
Versatile, Research-Grade AFM with Motorized Optics

XE-150
Premier Cross-Functional AFM with Motorized Sample Stage

XE-200
Enlarged Capacity Cross-Functional AFM with Motorized Sample Stage

XE-Bio
Bio Research in Nanoscale: In-liquid imaging by SICM and much more

XE-NSOM
For NSOM or Raman-AFM Measurements

 
XE-3DM
For Undercut Characterization and Sidewall Metrology

XE-CMP
For High Aspect Ratio Trench and CMP Metrology

XE-HDM
For General Hard Disk Media and Substrate Inspection and Metrology

XE-LCD
For Automated LCD Production Inspection and Metrology

XE-PTR
For In-Line Pole Tip Recession Metrology of Hard Disk Sliders

XE-WAFER
For Wafer-based Inspection and Metrology

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