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XE-70
Affordable, Research-Grade AFM with Flexible Sample Handling
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XE-100
Versatile, Research-Grade AFM with Motorized Optics
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XE-150
Premier Cross-Functional AFM with Motorized Sample Stage
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XE-200
Enlarged Capacity Cross-Functional AFM with Motorized Sample Stage
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XE-Bio
Bio Research in Nanoscale: In-liquid imaging by SICM and much more
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XE-NSOM
For NSOM or Raman-AFM Measurements
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XE-3DM
For Undercut Characterization and Sidewall Metrology
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XE-CMP
For High Aspect Ratio Trench and CMP Metrology
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XE-HDM
For General Hard Disk Media and Substrate Inspection and Metrology
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XE-LCD
For Automated LCD Production Inspection and Metrology
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XE-PTR
For In-Line Pole Tip Recession Metrology of Hard Disk Sliders
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XE-WAFER
For Wafer-based Inspection and Metrology
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Japanese
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