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XE-Bio
Non Contact In-liquid Imaging and Ion Conductance Microscopy
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XE-NSOM
For NSOM and Raman-AFM Measurements
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XE-70
Affordable, Research-Grade AFM with Flexible Sample Handling
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XE-100
Award-Winning Research-Grade AFM with Step-and-Scan Automation
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XE-120
For Combined Capability of XE-AFM and Inverted Optical Microscope
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XE-150
Premier Cross-Functional AFM with Motorized Sample Stage
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XE-HDM
Automatic Defect Review AFM for Hard Disk Media and Substrates
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XE-PTR
For In-Line Pole Tip Recession Metrology of Hard Disk Sliders
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XE-WAFER
For Wafer-based Inspection and Metrology
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XE-3DM
For Undercut Characterization and Sidewall Metrology
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XE-LCD
For Flat Panel Display Inspection and Metrology
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