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Looking for state-of-the art Atomic Force Microscope (AFM) instrumentation?


Park Systems¡¯ AFM solutions are derived from our innovations and meet the most rigorous
scientific research and nano-manufacturing process control requirements across various
fields. Park Systems instruments are engineered for advanced R&D modes and day-in,
day-out metrology processes monitoring at manufacturing facilities. Please contact us at your earliest convenience and we can share our experience with you.
The image of human blood. Here you can see red blood cells (doughnut shape) and a platelet (in the center of the image). 50μm scan size.
XE-100­
Versatile, Research-grade AFM with Motorized Optics
                                  
The XE-100 provides the ultimate solution for Non-Contact nanoscale metrology and the analysis of small samples in materials science, polymers, data storage, semiconductors, nanoscience, and electrochemistry.


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