The XE-Series can perform a full range of both standard and advanced functional SPM modes. Moreover, its versatile and elegant platform can be configured for diverse customized needs while utilizing all the standard XE features and benefits.
SICM Image of Bacteria sample: Topography(left) and simultaneously acquired Current error(right) whose scan size is 20 um.
Intact Clathrin Coated Pit on PM (AFM)
Intact Clathrin Coated Pit on PM (AFM)
Scan size: 600 nm
ICM images of paraformaldehyde (2%) fixed liver cell.
ICM images of paraformaldehyde (2%) fixed liver cell. The pictures show microvilli on the cell surface and the sustained structures of the cell membrane during the zooming in process.
SICM image of Live Cell
SICM Image of Live Mouse Lung Cell: Topography(left) and its enhanced color image(right) whose scan size is 5 um.
SICM images of live COS-1 cell
SICM images of live COS-1 cell: (a) and (c) are SICM images whose scan size are 30 um and 40 um, respectively. (b) and (d) are corresponding phase images.
Stoma on the underside of a leaf
Stoma, which regulates the gas exchange in plants, is imaged by AFM. The scan size is 45 µm.
Current map of a polymer film
A ferroelectric copolymer film is deposited on top of the silver film on glass. From the topography, the film does not seem to have much difference. When seen by Conductive AFM, the film shows significant difference in conductivity. Topography (top) and Conductive AFM image (bottom). The scan size is 40 µm in the X direction.
Ion implanted pattern on silicon wafer
Ion implanted pattern on silicon wafer is imaged by SCM (scanning capacitance microscopy). By measuring capacitance variation between the cantilever and the sample, SCM acquire the dopant profile from the results. The topography (left) shows the patterns on the silicon wafer. The SCM amplitude (middle) data shows the density of dopant, and the SCM phase (right) data shows the polarity of the dopant. Scan size is 10 µm.
NiO film
Grains of NiO film shows different electric property when measured with Conductive AFM.
The acquired current map (right) shows the variation among the grains. Scan size is 1 µm.
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