The current trend in storage devices is driving manufacturing and process control to the nano scale. The storage industry products also continuously push the limits as the demand for dynamic storage devices with high speed and capacity increases with the digital age. Atomic Force Microscopes (AFM) are a primary process-development and control tool for the creation of new storage device technologies. Park Systems provides highly reliable solutions for development and production monitoring of slider heads and disk media technology.
Featured Products XE-HDM - For Media and Substrate Inspection of Hard Disks XE-PTR - For In-line Pole Tip Recession Metrology of Hard Disk Sliders XE-3DM - For Undercut and Sidewall Metrology
Application Notes
Nanometrology of Magnetic Recording Industry AFM Applications to Tape
Japanese
Data Storage
