English
Chinese
Japanese
Korean
AFM Solutions
AFM Technology
AFM Buyer's Guide
Products
Gallery
Company
News
Contacts
Overview
Biological Science
Materials Science
Data Storage
Semiconductor
Research AFM
Industrial AFM
Overview
Park NX20
Park NX10
Park XE7
XE-Bio
XE-150
XE-120
XE-100
XE-70
Overview
XE-3DM
XE-Wafer
XE-PTR
XE-HDM
XE-LCD
Options
● Z Scanner Heads
● XY Scanners
● Probehands
● Liquid Cells
● Temperature Control
● Environmental Control
● Acoustic Enclosure
● Accessories
Modes
● Standard Imaging
● Conductive AFM
● Dielectric/Piezoelectric
● Electrical
● Force Measurement
● In-liquid Imaging
● Magnetic
● Mechanical
● Optical
● Thermal
Probes
● True Non-Contact Mode
● Contact Mode
● LFM
● FMM
● EFM/DC-EFM/SKPM
● MFM
● Conductive AFM / VECA / ULCA
● SCM
● Nanolithography
● Bio Application
Crosstalk Elimination (XE)
True Non-Contact Mode
TM
True Sample Topography
TM
Scanning Ion Conductance Microscopy
Application Notes
Biological Science
Materials Science
Data Storage
Semiconductors
References
Biological Science
Materials Science
Data Storage
Semiconductors
Others
True Non-Contact Imaging
Data Storage
Electrical Materials
Life Science
Nano Materials
Polymer
Semiconductor
Electrical Properties
Magnetic Properties
Mechanical Properties
Liquid Imaging
Bio SICM Imaging
Introduction
Company Profile
Partnership
Careers
Park User Website
Press Releases
Newsletters
Events
Exhibitions
Research Interviews
How AFM Works
How to Evaluate an AFM
Non-Contact Mode AFM
Non-Contact Mode AFM in Ambient Atmosphere
Ultimate Resolution of AFM in Air
Non-Contact Mode AFM vs. Tapping Mode AFM
Non-Contact Mode AFM for Soft Biological Samples
Advanced SPM Modes
Standard Imaging
Chemical
Dielectric/Piezoelectric
Electrical
Force Measurement
In-liquid Imaging
Magnetic
Mechanical
Optical
Thermal
AFM Technology
Crosstalk Elimination
True Non-Contact Mode
TM
True Sample Topography
TM
Park SICM
Application Notes
References
References
Biological Science
Materials Science
Data Storage
Semiconductors
Others
Subject
A nucleation study of group III-nitride multifunctional nanostructures, Journal of Crystal Growth 287, 596 (2006)
Carrier confinement and interband transition properties of InAs/GaAs quantum dots grown by using atomic layer epitaxy, Applied Surface Science 253, 3503 (2007)
Characteristics of mask layer on (1 0 0) silicon induced by tribo-nanolithography with diamond tip cantilevers based on AFM, Journal of Materials Processing Technology 187, 321 (2007)
Effects of abrasive particle size and molecular weight of poly(acrylic acid) in ceria slurry on removal selectivity of SiO2/Si3N4 films in shallow trench isolation chemical mechanical planarization, Journal of Material Research 22, 777 (2007)
Hydride vapour phase epitaxy growth and characterization of thick GaN using a vertical HVPE reactor, Journal of Crystal Growth 300, 32 (2007)
Influence of the AlN interlayer crystal quality on the strain evolution of GaN layer grown on Si (111), APL 90, 011914 (2007)
Interfacial and Electrokinetic Characterization of IPA Solutions Related to Semiconductor Wafer Drying and Cleaning, Journal of the Electrochemical Society 153, 811 (2006)
Interfacial and Electrokinetic Characterization of IPA Solutions Related to Semiconductor Wafer Drying and Cleaning, Journal of the Electrochemical Society 153, 811 (2006)
Measurement of the strength of adhesion of resist patterns using an atomic force microscope, Nanotechnology 16, 2227(2005)
Microstructure studies of the grinding damage in monocrystalline silicon wafers, Rare Metals 26, 13 (2007)
Multifunctionalization of organosilanes on submicron-sized island-type electrodes for the selective detection of metal ions, APL 88, 13113 (2006)
Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 24, 370 (2006)
Copyright © 2008 - Park Systems Corp. All Rights Reserved.
Contact us
|
Site Index
|
Register
|
Home
AFM
Technology 
References
