True Non-ContactTM Mode Preserves Sharp Tip
AFM tips are so brittle that touching a sample will instantly reduce the resolution and quality of the image they produce. For
soft and delicate samples,
the tip will also damage the sample and result in inaccurate sample height measurements, something that can cost you valuable t
ime and money.
True Non-ContactTM Mode, a scan mode unique to Park AFMs, consistently produces high resolution and accurate data while maintain
integrity of the sample
The sample image, shown in 1:1 aspect ratio, is an unprocessed raw data image of shallow trench isolation, taken by Park AFM; the depth is 3.7 μm, further confirmed by a scanning electron microscope (SEM). The two images on the right show no tip wear after taking 20 images of the sample.
Accurate Feedback by Faster Z-servo Enables True Non-Contact AFM
The benefits and the superiority of non-contact mode atomic force microscopy is well recognized: no tip wear, no sample damage, and maintenance of high resolution imaging, and high accuracy of AFM measurement. However, only Park has achieved what it calls True Non-ContactTM mode with its flexure-based high force Z-scanner. In True Non-ContactTM mode, the tip-sample distance is successfully maintained at a few nanometers in the net attractive regime of inter-atomic force. The small amplitude of tip oscillation minimizes the tip-sample interaction, resulting in superb tip preservation and negligible sample modification.