Force Modulation Microscopy (FMM)
FMM detect variations in the mechanical properties of the sample surface such as surface elasticity, adhesion, and viscosity. In FMM, the tip is in contact with the sample surface while the tip is oscillated as in non-contact mode. The sample surface is periodically pushed by the tip, and the change in cantilever oscillation amplitude can be related to elasticity of the sample surface.
For the product information of this advanced SPM mode offered by Park Systems, please click here.