Advanced SPM Modes

Scanning Tunneling Spectroscopy (STS)

Using a STM tip as a nanometer scale contact, STS spectroscopy provides a plot of the current (I) as a function of the tip bias voltage (V) applied to a sample. In order to investigate the electrical properties of the sample surface, I/V spectroscopy is measured on the selected sample area after taking a STM image. The spectroscopy data can be used to study the local electronic state of the sample.

For the product information of this advanced SPM mode offered by Park Systems, please click here.