Conductive AFM simultaneously images topography and conductivity of the sample surface. The local conductivity of a sample is acquired by placing a conducting cantilever on the sample surface and applying a bias between the cantilever and the sample. Conductive AFM detects the resulting current flow, which can be as low as a few pA. The typically low level of current measurement requires a detection scheme with a current noise level of sub pA.
Park Systems offers three current sensing options, detecting current signals from sub pA to mA.
• ULCA: < 0.1 pA noise level
• VECA: < 0.3 pA noise level with 6 decades of gain
• Internal Conductive AFM: <1 pA noise level
For the product information of this advanced SPM mode offered by Park Systems, please click here.