True Non-Contact ModeTM
The unprocessed raw data image of a styrene and divinylbenzen sphere (6 μm x 6 μm), displayed in 1:1 aspect ratio. Using True Non-Contact modeTM, any user can accurately and easily image the steep variations of such soft materials.
The 10 times improved speed in Z scan feedback of the XE-AFM makes True Non-Contact ModeTM in air practical for the first time in AFM industry. In True Non-Contact Mode, the tip-sample distance is successfully maintained at a few nanometers where the interaction remains in the net attractive regime of inter-atomic force. The key advantages of True Non-Contact Mode are:
• Ultimate lateral resolution due to preservation of a sharp tip
• Ability to image high aspect-ratio samples
• Ability to non-destructively image soft sample surfaces
• Longer tip life
For the product information of this advanced SPM mode offered by Park Systems, please click here.