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I-V Spectroscopy on SRAM

I-V Spectroscopy on SRAM. Conductive AFM techniques facilitate current-voltage (I-V) spectroscopy on specific location on the sample surface.

II-AFM
Cantilever : CDT-NCHR
Sample bias : -1V
Setpoint : 500nN, scan rate : 1Hz Using the VLCA - 10⁹ gain
I-V Spectroscopy on SRAM. Conductive AFM techniques facilitate current-voltage (I-V) spectroscopy on specific location on the sample surface.

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