Application Notes
AFM Technology
How SPM Works
XE Technology
Advanced SPM Modes
Application Notes
References
Atomic Force Microscope

Data Storage
Subject Download
Three-Dimensional Imaging of Undercut and Sidewall Structures by Atomic Force Microscopy view
Critical Roughness Metrology view
Undercut Structures and Sidewall Roughness view
Etched Silicon Structures view
AFM Metrology Considerations of Hard Disk Manufacturing view
Programmable Data Density (PDD) for High Throughput Feature Measurement view
New 3D-AFM for High Resolution Sidewall Imaging view
Automatic Defect Review AFM for Hard Disk Media and Substrates view
Patterned Arrays of Magnetic Nanostructures view

Semiconductors
Subject Download
New 3-Dimensional AFM for CD Measurement and Sidewall Characterization
Three-Dimensional Imaging of Undercut and Sidewall Structures by Atomic Force Microscopy
New 3D-AFM for High Resolution Sidewall Imaging
Etched Silicon Structures
Critical Roughness Metrology
Solar Cells
High Aspect Ratio Structure
Critical Dimension Measurement of High Aspect Ratio Trench with XE AFM
Chemical Mechanical Polishing (CMP) Metrology with Advanced AFM Surface Profiler

Polymer Science
Subject Download
Cross-section of Polymer Film
Polymer Composite
Phase Separation in the Co-Extruded Polymer
Green Chemical Polymer

Biological Science
Subject Download
Scanning Ion Conductance Microscopy (SICM) of Collagen Fibrils new
Single Strand DNA Molecules
DNA Oligonucleotides
Embryonic Stem Cell
Phase Separation in the Co-Extruded Polymer
Mouse Sperm Cells
Liposomes and Vesicles
Lipid Vesicle and Bilayer
Human Astrocytoma Cells
AFM and Confocal Microscopy

General Research
Subject Download
Hard-tip, Soft-spring Lithography
AlGaN/GaN HEMT Reliability
Atomic Force Microscopy and Raman Spectroscopy
Atomic Force Microscopy Investigation of 1D Structures Utilizing the XE-series Instruments
Characterization of Epitaxially Grown MnAs Films Using AFM and MFM
Characterization of Organic Photovoltaic Cells
Critical Roughness Metrology
Graphene (Step Height)
Graphene Membrane/Graphite
Nanoparticles/Nanotubes
Nanoscale Surface Photovoltage
Patterned Arrays of Magnetic Nanostructures
Production and Measurement of Nanodot Array
Quantum Dots/Photonic Devices
Single Crystal Yttrium Iron Garnet (YIG)
Solar Cells
SrTiO3 Surfaces by Using Park Systems XE-70 AFM
Surface Morphology of Electrospun Fibers
Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green Light Emitting Diode
Thin Film - ZnO
Thin Films Nanolithography (XEL)
Zinc Oxide Surfaces

Atomic Force Microscope
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