True Non-Contact Mode
Contact Mode
LFM
FMM
EFM/DC-EFM/SKPM
MFM
Conductive AFM / VECA / ULCA
SCM
Nanolithography
Bio Application
The World¡¯s Most Accurate AFM
Non Contact In-liquid Imaging and Ion Conductance Microscopy
Near-field Scanning Optical Microscopy built on Artifact-Free Imaging XE Platform
Affordable, Research-Grade AFM with Flexible Sample Handling
Award-Winning Research-Grade AFM with Step-and-Scan Automation
For Combined Capability of XE-AFM and Inverted Optical Microscope
Premier Cross-Functional AFM with Motorized Sample Stage
Automatic Defect Review AFM for Hard Disk Media and Substrates
Automated Industrial AFM for Metrology of Read/Write Heads
Automated Industrial AFM for In-line wafer Inspection and Metrology
Automated Industrial AFM for High-Resolution 3D Metrology
Automated Industrial AFM for In-line Flat Panel Inspection and Metrology
Research
AFM
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