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Main Application
Standard Imaging Required

True Non-Contact Mode

Phase Imaging

Contact Mode

Lateral Force Microscopy (LFM)

Dynamic Force microscopy(DFM)

Advanced Modes Required

Dielectric/Piezoelectric Properties

Enhanced Electric Force Microscopy (EFM)

Dynamic Contact EFM (DC-EFM)

Piezoelectric Force Microscopy (PFM)

Piezoelectric Response Spectroscopy

Scanning Kelvin Probe Microscopy (SKPM)
 

Electrical Properties

Scanning Capacitance Microscopy (SCM)

Scanning Kelvin Probe Microscopy (SKPM)

Scanning Spreading Resistance Microscopy (SSRM)

Scanning Tunneling Microscopy (STM)

Scanning Tunneling Spectroscopy (STS)

TIme-resolved Phtocurrent Mapping (Tr-PCM)

 

Force Measurement

Force-Distance Spectroscopy

Force Volume Imaging

 

In-liquid Imaging

Ion Conductance Microscopy (ICM)

AFM Imaging With Liquid Cells.
 

Magnetic Properties

Magnetic Force Microscopy (MFM)

Tunable Magnetic Field MFM (TM-MFM)

 

Mechanical Properties

Force Modulation Microscopy (FMM)

Nanoindentation

Nanolithography

 

Optical Properties

Transmission NSOM

Reflection NSOM

TERS (Tip-Enhanced Raman Spectroscopy)

 

Thermal Properties

Scanning Thermal Microscopy (SThM)

 

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Atomic Force Microscope
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